Topological Derivative for Fast Imaging of Two-Dimensional Thin Dielectric Inclusions in The Wave Propagation Environment

In this paper, we consider the topological derivative concept for developing a fast imaging algorithm of thin inclusions with dielectric contrast with respect to an embedding homogeneous domain with a smooth boundary. The topological derivative is evaluated by applying asymptotic expansion formulas in the presence of small, perfectly conducting cracks. Through the careful derivation, we can design a one-iteration imaging algorithm by solving an adjoint problem. Numerical experiments verify that this algorithm is fast, effective, and stable.