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학술논문반도체디스플레이기술학회지2015.06 발행

범용 부품을 이용한 M-PHY AFE Block 개발

Development of The M-PHY AFE Block Using Universal Components

최병선(에스에프유); 오호형(단국대학교)

14권 2호, 67~72쪽

초록

For the development of UFS device test system, M-PHY specifications should be matched with MIPI-standard which is analog signal protocol. In this paper, the implementation methodology and hardware structure for the M-PHY AFE (Analog Front End) Block was suggested that it can be implemented using universal components without ASIC process. The testing procedure has a jitter problem so to solve the problems we using ASIC process, normally but the ASIC process needs a lot of developing cost making the UFS device test system. In is paper, the suggestion was verified by the output signal which was compared to the MIPI-standard on the Prototype-board using universal components. The board was reduced the jitter on the condition of HS-TX and 5.824 Gbps Mode in SerDes (Serialize-deserializer). Finally, the suggestion and developed AFE block have a useful better than ASIC process on developing costs of the industrial UFS device test system.

Abstract

For the development of UFS device test system, M-PHY specifications should be matched with MIPI-standard which is analog signal protocol. In this paper, the implementation methodology and hardware structure for the M-PHY AFE (Analog Front End) Block was suggested that it can be implemented using universal components without ASIC process. The testing procedure has a jitter problem so to solve the problems we using ASIC process, normally but the ASIC process needs a lot of developing cost making the UFS device test system. In is paper, the suggestion was verified by the output signal which was compared to the MIPI-standard on the Prototype-board using universal components. The board was reduced the jitter on the condition of HS-TX and 5.824 Gbps Mode in SerDes (Serialize-deserializer). Finally, the suggestion and developed AFE block have a useful better than ASIC process on developing costs of the industrial UFS device test system.

발행기관:
한국반도체디스플레이기술학회
분류:
반도체공정

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범용 부품을 이용한 M-PHY AFE Block 개발 | 반도체디스플레이기술학회지 2015 | AskLaw | 애스크로 AI