반도체 검사 운영 효율성 향상 방안 : 전용 및 범용 장비의 할당과 생산의 연속성을 감안한 투입 관점을 중심으로

Semiconductors are used in almost all electronic products today, and their demand is increasing as the numberof uses increases with the development of technology. Also, the semiconductor features become extremelycomplicated and diversified. For semiconductor companies, the rapid changes require a large amount ofmachine investments, and will add up the manufacturing cost as well as affect the entire margin structurenegatively. Especially, the semiconductor test has to be designed to meet the speed, functionality and featureof the device under test, making it very difficult to standardize across various semiconductor devices. Theoutsourcing manufacturers consider the capital expenditures for the test operation is the one of the mostchallenging decision. In this paper, external instability factors such as wafer supply disconnection and customerdemand changes are excluded as much as possible in the final test stage of semiconductor production, and thecorrelation between facility operation rates according to various input scenarios is studied. Through this,efficient allocation of dedicated and general-purpose facilities increases the facility utilization rate, therebyreducing the buffer capacity. As a result, it is possible to prevent excessive facility investment, reducecorporate losses, and establish and implement stable production plans.